Lead the development, deployment, and production support of AI/ML-driven wafer-level and die-level image processing solutions for Automated Visual Inspection (AVI) tools used in front-end and back-end wafer fab operations.
Design, implement, and sustain advanced vision and image processing pipelines, including Crack detection and advanced defect classification, Die-to-die and wafer-level image stitching, Optical inspection data analysis.
Develop, train, validate, and maintain machine learning models used in AI-powered optical inspection, ensuring robustness, accuracy, and scalability in high-volume manufacturing environments.
Integrate AI/ML-based solutions with fab automation systems, leveraging in-situ equipment and process data to enable anomaly prediction and early detection for critical processes.
Work hands-on in the fab environment with automation team members, operations, process engineering, and equipment engineering teams to deploy, debug, and sustain automation, inspection, and process control solutions.
Ensure reliable data foundations for inspection and process control applications, including data quality, traceability, and consistency across equipment, inspection, and analytics systems.
Apply advanced analytics and machine learning techniques to improve inspection throughput and accuracy, process stability and yield, and root-cause identification.
Support high-volume manufacturing operations by responding to production issues, minimizing downtime, and ensuring automation and inspection systems meet fab performance and reliability requirements.
Requirements
Minimum 5 years' experience in data analytics in semiconductor, materials, or a related industry; or demonstratable equivalent abilities.
BS/MS or equivalent degrees in computer science, software engineering, physics, mathematics, statistics or similar STEM field.
Strong interpersonal, collaboration, and problem-solving skills, with the ability to work effectively in high-pressure manufacturing environments.
Experience modeling, analyzing, and validating complex, imperfect real-world manufacturing and inspection datasets, including image and in-situ equipment data.
Strong understanding of statistical fundamentals and their application to machine learning, defect detection, process monitoring, and anomaly identification.
Solid knowledge of semiconductor manufacturing processes; background in process engineering, materials science, or related natural sciences is a plus.