leading development of DFT solutions for next-generation ASICs
Lead implementation of SSN, hierarchical test flow DFT architectures, including scan insertion, compression/decompression logic, memory BIST, and logic BIST
Generate and deliver ATPG test pattern for stuck-at, transition, cell aware and path delay fault models
drive scan-based diagnosis methodology for Silicon failure debug
provide post-silicon testing and validation support
evaluate design readiness for scan insertion through RTL and physical design Scan Design Rule Check (DRC) tools
Integration and verification of Design for Test (DFT) fabrics and IP within Subsystems
Perform simulation runs and debug for non-timing and back annotated timing (SDF) gate level simulations
Develop test scripts, automate processes, and analyze data using programming languages such as Python, Tcl, or C++
Requirements
Bachelors + 8 years of related experience, or Masters + 6 years of related experience, or PhD + 3 years of related experience
Prior experience working with ASICs
Prior experience in scan insertion and DFT setup, integration and validation