Identify root cause yield limiters throughout the lifecycle of a technology node and develop solutions to address them
Perform statistical analysis and create visualizations to construct accurate process development roadmaps that drive technology yield milestones
Develop methodologies to consolidate and analyze data from diverse sources, enabling defect mode understanding and yield modeling
Transform experimental and manufacturing data into actionable insights that improve yield by leveraging advanced statistics, coding techniques, and engineering expertise.
Design and implement measurement recipes to deliver quick, precise feedback on product integrity and resolve yield-impacting issues
Collaborate with cross-functional teams to debug yield limiters in design, test, and process development areas
Develop and harden equipment and methodologies to meet the operational needs of advanced logic nodes
Ensure manufacturability by thoroughly analyzing process and spec corners and collaborating with design teams to resolve yield issues prior to manufacturing ramp
Execute new product introductions and enable design-technology co-optimization through participation in factory task forces and design of experiments.

Bachelor’s degree or higher required degree in a relevant field such as Electrical Engineering, Materials Science, Mechanical Engineering, Semiconductor Technology, or a closely related discipline
Bachelor's degree with 6+ years of experience OR Master's degree with 4+ years of experience OR PhD with 2+ years of experience in yield development, process technology, or a related field.
Proficiency in statistical analysis and data visualization tools
Technical expertise in semiconductor process development, defect density analysis, and data analytics
Experience with advanced semiconductor equipment and methodologies for process improvement
Experience with Defect Metrology
Experience working with brightfield, darkfield, and ebeam inspection
Experience working with semiconductor factories
Experience with failure analysis
Familiarity with machine learning approaches and their application in defect detection and yield modeling.

Defect Metrology Engineer

Key skills