Staff Defect Metrology AI/ML Engineer

Renesas Electronics is seeking a Staff Defect Metrology AI/ML Engineer to provide technical leadership in semiconductor defect inspection, data analytics, and advanced defect detection and classification. The role develops AI/ML and image-processing methods, analyzes manufacturing and metrology data, and partners with engineering teams to improve product quality, process control, and yield.

Responsibilities:

• Develop image-processing algorithms and AI/ML models to detect, classify, and quantify semiconductor defects such as particles, pits, and scratches
• Analyze large datasets from wafer inspection, metrology, and MOCVD processes to identify trends, correlations, anomalies, and root causes
• Develop automated analysis and visualization workflows using Python, SQL, JMP, Excel, and related tools
• Correlate incoming substrate defects with epitaxial defects and develop data-driven methods for substrate quality screening
• Integrate defect, process, equipment, and wafer-level data to improve understanding of defect mechanisms and yield drivers
• Partner with process, equipment, and development engineers to correlate defect excursions with process changes and equipment events
• Improve inspection methodologies, algorithms, calibrations, statistical metrics, and defect classification strategies
• Ensure the accuracy, repeatability, and integrity of defect metrology systems and associated data
• Apply DOE, SPC, statistical modeling, and data visualization to support process improvement
• Communicate technical findings and actionable recommendations to engineering teams, management, vendors, and customers